| Paper: | TA.L8.5 |
| Session: | Integrative Applications: Industrial |
| Session Time: | Tuesday, September 27, 10:30 - 12:30 |
| Presentation Time: | Tuesday, September 27, 11:50 - 12:10 |
| Presentation: |
Lecture
|
| Topic: |
Integrative Applications: Integrative Applications |
| Paper Title: |
MULTI-FEATURE SPARSE-BASED DEFECT DETECTION AND CLASSIFICATION IN SEMICONDUCTOR UNITS |
| Authors: |
Bashar Haddad; Arizona State University | | |
| | Lina J. Karam; Arizona State University | | |
| | Jieping Ye; Arizona State University | | |
| | Nital Patel; Intel Corporation | | |
| | Martin Braun; Intel Corporation | | |
